In this work we focus on Power Analysis Attacks (PAAs) which exploit the dependence of the static current of sub- 50nm CMOS integrated circuits on the internally processed data. Spice level simulations of static current as a function of the input state have been carried out to show that static power consumption of nanometer logic gates continues to exhibit a strong dependence on input vector even for sub-50nm circuits and that the coefficient of variation for a nand gate is strongly increasing with the scaling of CMOS technology. We demonstrate that it is possible to recover the secret key of a cryptographic core by exploiting this data dependence by means of different statistical distinguishers. For the first time in the literature we formulate the Attack Exploiting Static Power (AESP) as a univariate attack by using the mutual information approach to quantify the information that leaks through the static power side channel independently from the adopted leakage model. This analysis shows that countermeasures conceived to protect cryptographic hardware from attacks based on dynamic power consumption (e.g. WDDL, MDPL, SABL) still exhibit a leakage through the static power side channel. Finally, we show that the Time Enclosed Logic (TEL) concept does not leak information through the static power (even in the worst case scenario in which the attacker can stop the clock signal) and is suitable to be used as a countermeasure against both attacks explointig dynamic power and attacks exploiting static power.

Univariate power analysis attacks exploiting static dissipation of nanometer CMOS VLSI circuits for cryptographic applications / Bellizia, Davide; Bongiovanni, Simone; Monsurro', Pietro; Trifiletti, Alessandro; Scotti, Giuseppe. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - ELETTRONICO. - 5:3(2017), pp. 329-339. [10.1109/TETC.2016.2563322]

Univariate power analysis attacks exploiting static dissipation of nanometer CMOS VLSI circuits for cryptographic applications

BELLIZIA, DAVIDE;BONGIOVANNI, SIMONE;MONSURRO', PIETRO;TRIFILETTI, Alessandro;SCOTTI, Giuseppe
2017

Abstract

In this work we focus on Power Analysis Attacks (PAAs) which exploit the dependence of the static current of sub- 50nm CMOS integrated circuits on the internally processed data. Spice level simulations of static current as a function of the input state have been carried out to show that static power consumption of nanometer logic gates continues to exhibit a strong dependence on input vector even for sub-50nm circuits and that the coefficient of variation for a nand gate is strongly increasing with the scaling of CMOS technology. We demonstrate that it is possible to recover the secret key of a cryptographic core by exploiting this data dependence by means of different statistical distinguishers. For the first time in the literature we formulate the Attack Exploiting Static Power (AESP) as a univariate attack by using the mutual information approach to quantify the information that leaks through the static power side channel independently from the adopted leakage model. This analysis shows that countermeasures conceived to protect cryptographic hardware from attacks based on dynamic power consumption (e.g. WDDL, MDPL, SABL) still exhibit a leakage through the static power side channel. Finally, we show that the Time Enclosed Logic (TEL) concept does not leak information through the static power (even in the worst case scenario in which the attacker can stop the clock signal) and is suitable to be used as a countermeasure against both attacks explointig dynamic power and attacks exploiting static power.
2017
CMOS integrated circuits; CMOS technology; cryptography; logic gates; power demand; semiconductor device modeling; standards; cryptographic circuits; power analysis attacks; side-channel attacks; nanometer CMOS; static power
01 Pubblicazione su rivista::01a Articolo in rivista
Univariate power analysis attacks exploiting static dissipation of nanometer CMOS VLSI circuits for cryptographic applications / Bellizia, Davide; Bongiovanni, Simone; Monsurro', Pietro; Trifiletti, Alessandro; Scotti, Giuseppe. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - ELETTRONICO. - 5:3(2017), pp. 329-339. [10.1109/TETC.2016.2563322]
File allegati a questo prodotto
File Dimensione Formato  
Bellizia_preprint_univariate_2016.pdf

solo utenti autorizzati

Tipologia: Documento in Pre-print (manoscritto inviato all'editore, precedente alla peer review)
Licenza: Tutti i diritti riservati (All rights reserved)
Dimensione 1.86 MB
Formato Adobe PDF
1.86 MB Adobe PDF   Contatta l'autore
Bellizia_Univariate-power_2016.pdf

solo gestori archivio

Tipologia: Versione editoriale (versione pubblicata con il layout dell'editore)
Licenza: Tutti i diritti riservati (All rights reserved)
Dimensione 848.72 kB
Formato Adobe PDF
848.72 kB Adobe PDF   Contatta l'autore

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11573/874182
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 23
  • ???jsp.display-item.citation.isi??? 15
social impact